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Ever since the initial discovery of graphene, two-dimensional materials have been a significant subject of research. Graphene and other two-dimensional materials including Transition Metal Dichalcogenides like molybdenum disulfide (MoS₂) exhibit distinct mechanical, electrical, and electromechanical properties that make them promising for next-generation electronic devices and energy materials.

Atomic force microscopy (AFM) is uniquely well-suited to the study of two-dimensional materials, both because of its atomic and molecular resolution imaging of material topography, and because of the multitude of mechanical and electrical properties that it can measure at the nanoscale.

This webcast will begin with a brief introduction to the many capabilities that AFM provides for 2D materials research, illustrated by examples from recent research to provide a broad overview of how AFM is helping to advance our understanding of these materials.

Dr. Zhihai Cheng, Professor of Physics at Renmin University of China, will then present results from several of his group’s research projects on the interfacial structures and properties of 2D Materials, including a study of strain-induced anisotropic shear behaviour, visualization and effects of water-intercalation at the homo-/hetero-interfaces, and interfacial strain-induced patterned mechanical and electronical structures at a MoS₂/SiO₂ and WS₂/SiO₂ interface.

• Resolve the structure of 2D materials to evaluate their preparation and modification
• Measure and map the unique electrical and mechanical properties of 2D materials
• Evaluate the performance of 2D materials incorporated within proposed devices